| 1 |
Shekhar P., Pendharker S. , Vick D. , Malac M. , Jacob Z, Fast electrons interacting with a natural hyperbolic medium: bismuth telluride, Optics Express, 27, 6970-6975, 2019 |
| 2 |
Shekhar P., Pendharker S. , Sahasrabudhe H. , Vick D. , Malac M. , Rahman R. , Jacob Z., Extreme ultraviolet plasmonics and Cherenkov radiation in silicon, Optica, 5, 1590-1596, 2018 |
| 3 |
Pendharker S., Kalhor F. , Van Mechelen T. , Jahani S. , Nazemifard N. , Thundat T. , Jacob Z., Spin photonic forces in non-reciprocal waveguides, Optics Express, 26, 2018 |
| 4 |
Pendharker S., Guo Y. , Khosravi F. , Jacob Z, PT-symmetric spectral singularity and negative-frequency resonance, Physical Review A, 95, 2017 |
| 5 |
Pendharker S., Hu H. , Molesky S. , Starko-bowes R. , Poursoti Z. , Pramanik S. , Nazemifard N. , Fedosejevs R. , Thundat T. , Jacob Z., Thermal graphene metamaterials and epsilon-near-zero high temperature plasmonics, Journal of Optics, 19, 2017 |
| 6 |
Pendharker S., Shende S. , Jacob Z. , Nazemifard N., Three-dimensional optical tomography of bitumen and clay association in oil sands tailings, Fuel, 207, 262-267, 2017 |
| 7 |
Pendharker S., Shende S. , Newman W. , Ogg S. , Nazemifard N. , Jacob Z, Axial super-resolution evanescent wave tomography, Optics Letters, 41, 5499-5502, 2016 |
| 8 |
Shende S., Pendharker S. , Jacob Z. , Nazemifard N, Total internal reflection fluorescence microscopy to investigate the distribution of residual bitumen in oil sands tailings, Energy & Fuels, 30, 5537-5546, 2016 |
| 9 |
Pendharker S., Chandorkar A. N., Shevgaonkar R. K., Optically controlled frequency reconfigurable band stop filter with multifrequency switching, Microwave and Optical Technology Letters, 56, 1204-1211, 2014 |
| 10 |
Pendharker S., Chandorkar A. N., Shevgaonkar R. K, Optically controlled frequency-reconfigurable microstrip antenna with low photoconductivity, IEEE antennas and wireless propagation letters, 13, 99-102, 2014 |
| 11 |
Patil P. B., Pendharker S. , Shevgaonkar R. K, Electrical modeling of photonic crystal defects, Microwave and Optical Technology Letters, 54, 2522-2528, 2012 |
