| 1 |
De'souza S., Soumya J. , Chattopadhyay S., A constructive heuristic for application mapping onto an express channel based Network-on-Chip, VDAT, 1-6, 2015 |
| 2 |
Dutta A., Kundu S. , Chattopadhyay S. , Das B. K., A hardware based low temperature solution for VLSI testing using decompressor side masking, Dutta A., Kundu S. , Chattopadhyay S. , Das B. K., 637-640, 2015 |
| 3 |
Nuthakki S. S., Chattopadhyay S., An Integrated Approach for Improving Compression and Diagnostic Properties of Test Sets, ATS, 151-156, 2015 |
| 4 |
Chatterjee N., Chattopadhyay S., Fault tolerant mesh based Network-on-Chip architecture, ISCAS, 417-420, 2015 |
| 5 |
Bhar A., Chattopadhyay S. , Sengupta I. , Kapur R., GA based diagnostic test pattern generation for transition faults, VDAT, 1-6, 2015 |
| 6 |
Dutta A., Chattopadhyay S., Particle swarm optimization approach for low temperature BIST, VDAT, 1-6, 2015 |
| 7 |
Chattopadhyay S, Power- and thermal-aware testing of VLSI circuits and systems, VDAT, 1-1, 2015 |
| 8 |
Karmakar R., Agarwal A. , Chattopadhyay S., Test Infrastructure Development and Test Scheduling of 3D-Stacked ICs under Resource and Power Constraints, ATS, 73-78, 2015 |
| 9 |
Karmakar R., Agarwal A. , Chattopadhyay S, Testing of 3D-stacked ICs with hard- and soft-dies - a Particle Swarm Optimization based approach, VTS, 1-6, 2015 |
| 10 |
Nuthakki S. S., Chattopadhyay S. , Chakraborty M., Test set customization for improved fault diagnosis without sacrificing coverage, ISCAS, 1574-1577, 2015 |
| 11 |
Karmakar R., Chattopadhyay S., Thermal-Aware Test Data Compression Using Dictionary Based Coding, VLSI Design, 53-58, 2015 |
| 12 |
Manna K., Teja V. S., Chattopadhyay S. , Sengupta I., TSV Placement and Core Mapping for 3D Mesh Based Network-on-Chip Design Using Extended Kernighan-Lin Partitioning, ISVLSI, 392-397, 2015 |
| 13 |
Ghosh S. K., Maroju S. , Dutta D. , Biswas P. K., Datta R. , Dhang N., Multivariate Autoregressive Statistical Time Series Methods for Damage Localization in Civil Structures, 5th Structural engineers World Congress (SEWC), 2015 |
| 14 |
Ravi C., Sarma V. , Sahoo B., At Speed Digital Gain Error Calibration of Pipelined ADCs, International New Circuits and Systems Conference, 2015 |
| 15 |
Budkuley A. J., Dey B. K., Prabhakaran V. M., Dirty paper arbitrarily varying channel with a state-aware adversary, IEEE International Symposium on Information Theory, 94-98, 2015 |
| 16 |
Budkuley A. J., Jamming in fading Multiple Access Channels, National Conference on Communication, 1-6, 2015 |
